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Bulk and surface structural properties of Si$_{1-x-y}$Ge$_x$C$_y$ layers processed on Si(001) by pulsed laser induced epitaxy

C. Guedj J. Boulmer D. Bouchier C. Clerc 1 G. Calvarin C. Godet Pere Roca I Cabarrocas F. Houze D. Mencaraglia
1 CSNSM PS1
CSNSM - Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse, CSNSM - Centre de Sciences Nucléaires et de Sciences de la Matière
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http://hal.in2p3.fr/in2p3-00000499
Contributor : Jocelyne Lorgeril <>
Submitted on : Thursday, February 18, 1999 - 10:40:53 AM
Last modification on : Wednesday, September 16, 2020 - 5:37:35 PM

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C. Guedj, J. Boulmer, D. Bouchier, C. Clerc, G. Calvarin, et al.. Bulk and surface structural properties of Si$_{1-x-y}$Ge$_x$C$_y$ layers processed on Si(001) by pulsed laser induced epitaxy. Applied Surface Science, Elsevier, 1996, 102, pp.28-32. ⟨in2p3-00000499⟩

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