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Effect of radiation-induced substrate defects on microstrip gas chamber gain behaviour

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http://hal.in2p3.fr/in2p3-00003332
Contributor : Yvette Heyd <>
Submitted on : Friday, December 10, 1999 - 3:35:12 PM
Last modification on : Thursday, April 23, 2020 - 2:26:11 PM

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  • HAL Id : in2p3-00003332, version 1

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A. Pallares, J.C. Fontaine, J.M. Brom, A.M. Bergdolt, J. Coffin, et al.. Effect of radiation-induced substrate defects on microstrip gas chamber gain behaviour. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Elsevier, 1998, 412, pp.265-277. ⟨in2p3-00003332⟩

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