Skip to Main content Skip to Navigation
Conference papers

Amorphous semiconductor sample preparation for transmission EXAFS measurements

Complete list of metadata

http://hal.in2p3.fr/in2p3-00003776
Contributor : Jocelyne Lorgeril <>
Submitted on : Wednesday, January 12, 2000 - 3:33:21 PM
Last modification on : Wednesday, September 16, 2020 - 4:06:33 PM

Identifiers

  • HAL Id : in2p3-00003776, version 1

Collections

Citation

M.C. Ridgway, C.J. Glover, H.H. Tan, A. Clark, F. Karouta, et al.. Amorphous semiconductor sample preparation for transmission EXAFS measurements. Applications of Synchrotron Radiation Techniques to Materials Science 4, Apr 1998, San Francisco, United States. pp.309-314. ⟨in2p3-00003776⟩

Share

Metrics

Record views

87