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Electron-impact ionization and energy loss of 27 MeV/u Xe$^{35}$ incident ions channeled in silicon

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http://hal.in2p3.fr/in2p3-00004207
Contributor : Sylvie Flores <>
Submitted on : Monday, March 20, 2000 - 12:01:20 PM
Last modification on : Friday, March 5, 2021 - 3:05:12 PM

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S. Andriamonje, R. Anne, N.V. De Castro Faria, M. Chevallier, C. Cohen, et al.. Electron-impact ionization and energy loss of 27 MeV/u Xe$^{35}$ incident ions channeled in silicon. Physical Review Letters, American Physical Society, 1989, 63, pp.1930-1933. ⟨10.1103/PhysRevLett.63.1930⟩. ⟨in2p3-00004207⟩

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