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A submicron precision silicon telescope for beam test purposes

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http://hal.in2p3.fr/in2p3-00004261
Contributor : Yvette Heyd <>
Submitted on : Wednesday, March 22, 2000 - 4:19:47 PM
Last modification on : Thursday, April 23, 2020 - 2:26:12 PM

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C. Colledani, W. Dulinski, R. Turchetta, F. Djama, A. Rudge, et al.. A submicron precision silicon telescope for beam test purposes. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Elsevier, 1996, 372, pp.379-384. ⟨in2p3-00004261⟩

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