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Thick target x-ray yields and intensity ratios for MeV Br and Kr ion impact and application to the analysis of ottery

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http://hal.in2p3.fr/in2p3-00006387
Contributor : Yvette Heyd <>
Submitted on : Tuesday, October 3, 2000 - 8:27:12 AM
Last modification on : Thursday, April 23, 2020 - 2:26:15 PM

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  • HAL Id : in2p3-00006387, version 1

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D. Tenorio, G. Costa, M. Bordas, J. Larcher, G. Lagarde, et al.. Thick target x-ray yields and intensity ratios for MeV Br and Kr ion impact and application to the analysis of ottery. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 1986, 15, pp.612. ⟨in2p3-00006387⟩

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