Characteristics and window thicknesses of ion implanted semiconductor detectors

docType_s : Journal articles


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Submitted on : Tuesday, January 2, 2001 - 1:00:13 PM
Last modification on : Tuesday, January 2, 2001 - 1:00:13 PM

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  • HAL Id : in2p3-00007963, version 1

Citation

P. Sebillotte, P. Siffert, A. Coche. Characteristics and window thicknesses of ion implanted semiconductor detectors. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers (IEEE), 1970, 17, pp.24-32. <in2p3-00007963>

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