Characteristics and window thicknesses of ion implanted semiconductor detectors

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Journal articles
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers (IEEE), 1970, 17, pp.24-32


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Submitted on : Tuesday, January 2, 2001 - 1:00:13 PM
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  • HAL Id : in2p3-00007963, version 1

Citation

P. Sebillotte, P. Siffert, A. Coche. Characteristics and window thicknesses of ion implanted semiconductor detectors. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers (IEEE), 1970, 17, pp.24-32. <in2p3-00007963>

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