Characteristics and window thicknesses of ion implanted semiconductor detectors

Document type :
Journal articles
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers (IEEE), 1970, 17, pp.24-32


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Submitted on : Tuesday, January 2, 2001 - 1:13:14 PM
Last modification on : Tuesday, January 2, 2001 - 1:13:14 PM

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P. Sebillotte, P. Siffert, A. Coche. Characteristics and window thicknesses of ion implanted semiconductor detectors. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers (IEEE), 1970, 17, pp.24-32. <in2p3-00007963>

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