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Radiative electron capture by 60 MeV/A highly charged Kr ions channeled in a silicon single crystal - Amplitude and line shape analysis

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http://hal.in2p3.fr/in2p3-00008247
Contributor : Sylvie Flores <>
Submitted on : Tuesday, February 6, 2001 - 3:15:31 PM
Last modification on : Wednesday, March 10, 2021 - 6:33:19 PM

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  • HAL Id : in2p3-00008247, version 1

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S. Andriamonje, M. Chevallier, D. Dauvergne, R. Kirsch, J.-C. Poizat, et al.. Radiative electron capture by 60 MeV/A highly charged Kr ions channeled in a silicon single crystal - Amplitude and line shape analysis. International Conference PEAC 18, Jul 1993, Aarhus, Germany. ⟨in2p3-00008247⟩

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