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Depht of origin of secondary ions resulting from electronic sputtering of ultra-thin layers

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http://hal.in2p3.fr/in2p3-00008250
Contributor : Sylvie Flores <>
Submitted on : Tuesday, February 6, 2001 - 3:42:02 PM
Last modification on : Tuesday, November 19, 2019 - 2:44:18 AM

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  • HAL Id : in2p3-00008250, version 1

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H. Allali, B. Nsouli, J.-P. Thomas. Depht of origin of secondary ions resulting from electronic sputtering of ultra-thin layers. Particle Desorption Mass Analysis, Jun 1993, Kleinwalsertal, Austria. ⟨in2p3-00008250⟩

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