Skip to Main content Skip to Navigation
Journal articles

Thin layers composition and impurities determination using low energy proton X-ray excitation

Document type :
Journal articles
Complete list of metadata

http://hal.in2p3.fr/in2p3-00008268
Contributor : Sylvie Flores Connect in order to contact the contributor
Submitted on : Wednesday, February 7, 2001 - 4:38:06 PM
Last modification on : Friday, September 10, 2021 - 1:50:04 PM

Identifiers

  • HAL Id : in2p3-00008268, version 1

Collections

Citation

J.-P. Thomas, L. Porte, J. Engerran, J-C. Viala, J. Tousset. Thin layers composition and impurities determination using low energy proton X-ray excitation. Nuclear Instruments and Methods, Elsevier, 1974, 117, pp.579. ⟨in2p3-00008268⟩

Share

Metrics

Record views

426