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Behaviour of post insulators during UHV DC tests

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http://hal.in2p3.fr/in2p3-00008552
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Thursday, March 29, 2001 - 4:47:36 PM
Last modification on : Thursday, April 23, 2020 - 2:26:16 PM

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  • HAL Id : in2p3-00008552, version 1

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F. Osswald, M. Roumie. Behaviour of post insulators during UHV DC tests. IEEE Transactions on Dielectrics and Electrical Insulation, Institute of Electrical and Electronics Engineers, 2001, 8, pp.150. ⟨in2p3-00008552⟩

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