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Soft X-ray sensitivity of a photon-counting hybrid pixel detector with a silicon sensor matrix

Abstract : We have tested a CMOS pixel readout circuit bump-bonded to a high resistivity silicon sensor to study the noise properties of the system and to determine the lower limit in energy for the detection of X-rays at room temperature. Our test shows that single photon counting is possible down to about 5 keV, and we obtain a mean total noise equivalent to142 electrons on the electronics input.
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http://hal.in2p3.fr/in2p3-00010034
Contributor : Magali Damoiseaux Connect in order to contact the contributor
Submitted on : Tuesday, July 10, 2001 - 2:41:27 PM
Last modification on : Tuesday, October 19, 2021 - 10:50:08 PM

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  • HAL Id : in2p3-00010034, version 1

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A. Fornaini, D. Calvet, J.L. Visschers. Soft X-ray sensitivity of a photon-counting hybrid pixel detector with a silicon sensor matrix. International workshop on radiation imaging detectors 2, Jul 2000, Freiburg I Br., Germany. pp.142-145. ⟨in2p3-00010034⟩

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