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Channeling of fast Pb$^{56+}$ ions in a thin silicon crystal: simultaneous measurements of energy loss charge exchange and secondary electron emission

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http://hal.in2p3.fr/in2p3-00010704
Contributor : Sylvie Flores Connect in order to contact the contributor
Submitted on : Tuesday, December 18, 2001 - 9:05:40 AM
Last modification on : Friday, September 10, 2021 - 1:50:05 PM

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  • HAL Id : in2p3-00010704, version 1

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N. Cue, D. Dauvergne, M. Fallavier, R. Kirsch, J.-C. Poizat, et al.. Channeling of fast Pb$^{56+}$ ions in a thin silicon crystal: simultaneous measurements of energy loss charge exchange and secondary electron emission. International Conference on Atomic Collisions in Solids 19, Jul 2001, Paris, France. ⟨in2p3-00010704⟩

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