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Ellipsometric studies of annealing of SiO$_2$ layers during the formation of light-emitting Si nanocrystals in them

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http://hal.in2p3.fr/in2p3-00011201
Contributor : Jocelyne Lorgeril <>
Submitted on : Wednesday, February 13, 2002 - 3:41:10 PM
Last modification on : Wednesday, September 16, 2020 - 4:06:34 PM

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  • HAL Id : in2p3-00011201, version 1

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T. Khasanov, A.S. Mardezhov, S.G. Yanovskaya, G.A. Kachurin, O. Kaitasov. Ellipsometric studies of annealing of SiO$_2$ layers during the formation of light-emitting Si nanocrystals in them. Optics and Spectroscopy, MAIK Nauka/Interperiodica, 2001, 90, pp.924-927. ⟨in2p3-00011201⟩

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