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Radiation damages in double-sided silicon strip module

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http://hal.in2p3.fr/in2p3-00012303
Contributor : Yvette Heyd <>
Submitted on : Tuesday, September 3, 2002 - 9:21:28 AM
Last modification on : Monday, December 7, 2020 - 4:22:14 PM

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  • HAL Id : in2p3-00012303, version 1

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Marie Germain, L. Arnold, J. Baudot, D. Bonnet, J.P. Coffin, et al.. Radiation damages in double-sided silicon strip module. 5th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors, Jul 2001, Florence, Italy. pp.121-125. ⟨in2p3-00012303⟩

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