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Rte measurement with Xe$^{52+}$ ions channeled in a Si crystal

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http://hal.in2p3.fr/in2p3-00013108
Contributor : Sylvie Flores Connect in order to contact the contributor
Submitted on : Wednesday, March 17, 1999 - 4:12:23 PM
Last modification on : Friday, September 10, 2021 - 1:50:22 PM

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  • HAL Id : in2p3-00013108, version 1

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S. Andriamonje, M. Chevallier, C. Cohen, N. Cue, D. Dauvergne, et al.. Rte measurement with Xe$^{52+}$ ions channeled in a Si crystal. Physics Letters A, Elsevier, 1992, 164, pp.184-190. ⟨in2p3-00013108⟩

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