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Electrically active defects in detector-grade CdTe:Cl and CdZnTe materials grown by THM and HpBm

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http://hal.in2p3.fr/in2p3-00015150
Contributor : Yvette Heyd <>
Submitted on : Friday, March 24, 2000 - 4:34:02 PM
Last modification on : Thursday, April 23, 2020 - 2:26:18 PM

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L. Chibani, M. Hage-Ali, P. Siffert. Electrically active defects in detector-grade CdTe:Cl and CdZnTe materials grown by THM and HpBm. Journal of Crystal Growth, Elsevier, 1996, 161, pp.153-158. ⟨in2p3-00015150⟩

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