Skip to Main content Skip to Navigation
Journal articles

Charge accumulation at the interface between two dielectrics and gas gain variation of microstrip gas chambers

Complete list of metadata

http://hal.in2p3.fr/in2p3-00015195
Contributor : Yvette Heyd <>
Submitted on : Wednesday, March 29, 2000 - 4:05:52 PM
Last modification on : Thursday, April 23, 2020 - 2:26:18 PM

Identifiers

  • HAL Id : in2p3-00015195, version 1

Collections

Citation

R. Fang, R. Blaes, J.M. Brom, W.M. Geist, A. Michalon, et al.. Charge accumulation at the interface between two dielectrics and gas gain variation of microstrip gas chambers. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Elsevier, 1995, 365, pp.59-64. ⟨in2p3-00015195⟩

Share

Metrics

Record views

188