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Beam tests of a fast-RICH prototype with VLSI readout electronics

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http://hal.in2p3.fr/in2p3-00015399
Contributor : Yvette Heyd <>
Submitted on : Tuesday, May 2, 2000 - 7:05:39 AM
Last modification on : Wednesday, September 23, 2020 - 4:32:55 AM

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J. Seguinot, T. Ypsilantis, J.P. Jobez, R. Arnold, J.L. Guyonnet, et al.. Beam tests of a fast-RICH prototype with VLSI readout electronics. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Elsevier, 1994, 350, pp.430-463. ⟨in2p3-00015399⟩

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