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Sensitivity of trace-element analysis by X-ray emission induced by 0.1-10 MeV electrons

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http://hal.in2p3.fr/in2p3-00015455
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Thursday, May 4, 2000 - 3:07:16 PM
Last modification on : Thursday, April 23, 2020 - 2:26:18 PM

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A.P. Georgiadis, D. Apostolakis, M. Vourkas, A. Pape. Sensitivity of trace-element analysis by X-ray emission induced by 0.1-10 MeV electrons. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 1990, 50, pp.321. ⟨in2p3-00015455⟩

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