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Ar ion induced X-ray emission for the analysis of light elements in CdTe

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http://hal.in2p3.fr/in2p3-00015880
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Tuesday, May 30, 2000 - 1:31:23 PM
Last modification on : Thursday, April 23, 2020 - 2:26:19 PM

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  • HAL Id : in2p3-00015880, version 1

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A. Al-Neami, A.K. Al-Neami, M. Bordas, M. Hage-Ali, J. Larcher, et al.. Ar ion induced X-ray emission for the analysis of light elements in CdTe. Spring Meeting of the European Materials Research Society (E-Mrs) Symposium C on High Energy Ion Implantation Symposium D on Ion Beam Synthesis of Compound and Element Layers Symposium F on Nuclear Methods in Semiconductor Physics, May 1991, Strasbourg, France. pp.71-76. ⟨in2p3-00015880⟩

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