Skip to Main content Skip to Navigation
Journal articles

Defect reactions in copper-diffused and quenched p-type silicon

Document type :
Journal articles
Complete list of metadata

http://hal.in2p3.fr/in2p3-00015892
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Tuesday, May 30, 2000 - 3:55:16 PM
Last modification on : Wednesday, February 17, 2021 - 3:26:04 PM

Identifiers

  • HAL Id : in2p3-00015892, version 1

Collections

Citation

A. Mesli, T. Heiser. Defect reactions in copper-diffused and quenched p-type silicon. Physical Review B: Condensed Matter and Materials Physics (1998-2015), American Physical Society, 1992, 45, pp.11632-11641. ⟨in2p3-00015892⟩

Share

Metrics

Record views

212