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Development of a resonant ionization mass spectrometer for surface analysis

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http://hal.in2p3.fr/in2p3-00015895
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Tuesday, May 30, 2000 - 4:14:22 PM
Last modification on : Thursday, April 23, 2020 - 2:26:19 PM

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  • HAL Id : in2p3-00015895, version 1

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L. Johann, R. Sruck, P. Kern, B. Sipp, P. Siffert. Development of a resonant ionization mass spectrometer for surface analysis. Ris 92, May 1992, Santa Fe, United States. pp.283-286. ⟨in2p3-00015895⟩

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