Skip to Main content Skip to Navigation
Conference papers

Secondary ion emission under cluster impact at low energies (5-60 KeV), influence of the number of atoms in the projectile

Document type :
Conference papers
Complete list of metadata

http://hal.in2p3.fr/in2p3-00015984
Contributor : Suzanne Robert Connect in order to contact the contributor
Submitted on : Monday, June 5, 2000 - 3:40:03 PM
Last modification on : Thursday, November 19, 2020 - 2:20:21 PM

Identifiers

  • HAL Id : in2p3-00015984, version 1

Collections

Citation

K. Boussofiane-Baudin, G. Bolbach, A. Brunelle, S. Della-Negra, P. Hakansson, et al.. Secondary ion emission under cluster impact at low energies (5-60 KeV), influence of the number of atoms in the projectile. Conference on Polyatomic Ion Impact on Solids and Related Phenomena, Jun 1993, Saint-Malo, France. pp.160-163. ⟨in2p3-00015984⟩

Share

Metrics

Record views

92