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Damage induced by high electronic stopping power in SiO$_2$ quartz

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http://hal.in2p3.fr/in2p3-00016158
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Thursday, June 29, 2000 - 8:13:33 AM
Last modification on : Wednesday, February 17, 2021 - 11:50:40 AM

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  • HAL Id : in2p3-00016158, version 1

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M. Toulemonde, E. Balanzat, S. Bouffard, J.J. Grob, M. Hage-Ali, et al.. Damage induced by high electronic stopping power in SiO$_2$ quartz. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 1990, 46, pp.64. ⟨in2p3-00016158⟩

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