Skip to Main content Skip to Navigation
Journal articles

Analysis of superconducting thin films by ion beam methods. Comparison of nuclear techniques and SIMS

J.P. Stoquert 1 E. Fogarassy 1 R. Stuck 1 G. Guillaume 1 P. Siffert 1 J. Perriere
1 IReS - Institut de Recherches Subatomiques
Document type :
Journal articles
Complete list of metadata
http://hal.in2p3.fr/in2p3-00016159
Contributor : Yvette Heyd <>
Submitted on : Thursday, June 29, 2000 - 8:17:44 AM
Last modification on : Thursday, April 23, 2020 - 2:26:19 PM

Identifiers

  • HAL Id : in2p3-00016159, version 1

Collections

CNRS | CGE | IN2P3 | SITE-ALSACE

Citation

J.P. Stoquert, E. Fogarassy, R. Stuck, G. Guillaume, P. Siffert, et al.. Analysis of superconducting thin films by ion beam methods. Comparison of nuclear techniques and SIMS. Surface and Interface Analysis, Wiley-Blackwell, 1990, 15, pp.57. ⟨in2p3-00016159⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

288