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Analysis of superconducting thin films by ion beam methods. Comparison of nuclear techniques and SIMS

J.P. Stoquert 1 E. Fogarassy 1 R. Stuck 1 G. Guillaume 1 P. Siffert 1 J. Perriere
1 IReS - Institut de Recherches Subatomiques
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http://hal.in2p3.fr/in2p3-00016159
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Thursday, June 29, 2000 - 8:17:44 AM
Last modification on : Thursday, April 23, 2020 - 2:26:19 PM

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  • HAL Id : in2p3-00016159, version 1

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J.P. Stoquert, E. Fogarassy, R. Stuck, G. Guillaume, P. Siffert, et al.. Analysis of superconducting thin films by ion beam methods. Comparison of nuclear techniques and SIMS. Surface and Interface Analysis, Wiley-Blackwell, 1990, 15, pp.57. ⟨in2p3-00016159⟩

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