Analysis of superconducting thin films by ion beam methods. Comparison of nuclear techniques and SIMS

J.P. Stoquert; E. Fogarassy; R. Stuck; G. Guillaume; P. Siffert; J. Perriere

Journal articles

Analysis of superconducting thin films by ion beam methods. Comparison of nuclear techniques and SIMS

J.P. Stoquert ¹ E. Fogarassy ¹ R. Stuck ¹ G. Guillaume ¹ P. Siffert ¹ J. Perriere

1 IReS - Institut de Recherches Subatomiques

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Journal articles

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Submitted on : Thursday, June 29, 2000 - 8:17:44 AM
Last modification on : Thursday, April 23, 2020 - 2:26:19 PM

Analysis of superconducting thin films by ion beam methods. Comparison of nuclear techniques and SIMS

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Analysis of superconducting thin films by ion beam methods. Comparison of nuclear techniques and SIMS

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