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The combined use of a singly charged ion beam and undulator radiation for photoelectron spectrometry studies on atomic ions

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http://hal.in2p3.fr/in2p3-00016201
Contributor : Suzanne Robert Connect in order to contact the contributor
Submitted on : Monday, July 3, 2000 - 12:03:10 PM
Last modification on : Wednesday, September 16, 2020 - 4:03:40 PM

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J.M. Bizau, D. Cubaynes, M. Richter, F. Wuillemer, J. Obert, et al.. The combined use of a singly charged ion beam and undulator radiation for photoelectron spectrometry studies on atomic ions. Review of Scientific Instruments, American Institute of Physics, 1992, 63, pp.1389-1392. ⟨in2p3-00016201⟩

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