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On depth profiling from pixe yields

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http://hal.in2p3.fr/in2p3-00016658
Contributor : Suzanne Robert <>
Submitted on : Wednesday, August 30, 2000 - 4:46:17 PM
Last modification on : Wednesday, September 16, 2020 - 4:04:14 PM

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  • HAL Id : in2p3-00016658, version 1

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P. Regnier, I. Brissaud. On depth profiling from pixe yields. Journal of Radioanalytical and Nuclear Chemistry Letters, 1987, 117, pp.111-120. ⟨in2p3-00016658⟩

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