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On the role of interfacial defect sites during solid phase epitaxial regrowth of implantation amorphized siliconpi

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http://hal.in2p3.fr/in2p3-00017460
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Tuesday, September 26, 2000 - 3:52:38 PM
Last modification on : Thursday, April 23, 2020 - 2:26:19 PM

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W.O. Adekoya, M. Hage-Ali, J.C. Muller, P. Siffert. On the role of interfacial defect sites during solid phase epitaxial regrowth of implantation amorphized siliconpi. Materials Research Society Symposia Proceedings, 1988, 100, pp.447. ⟨in2p3-00017460⟩

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