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Beam test results of an ion-implanted silicon strip detector on a 100 mm wafer

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http://hal.in2p3.fr/in2p3-00017884
Contributor : Jean-Michel Levy Connect in order to contact the contributor
Submitted on : Monday, October 23, 2000 - 1:58:04 PM
Last modification on : Friday, April 10, 2020 - 5:03:59 PM

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  • HAL Id : in2p3-00017884, version 1

Citation

I. Hietanen, J. Lindgren, R. Orava, T. Tuuva, R. Brenner, et al.. Beam test results of an ion-implanted silicon strip detector on a 100 mm wafer. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Elsevier, 1991, 305, pp.173-176. ⟨in2p3-00017884⟩

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