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Conference papers
Trace analysis in cadmium telluride by heavy ion induced X-ray emission and by SIMS
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IReS - Institut de Recherches Subatomiques (23 rue du Loess - BP 28 - 67037 Strasbourg Cedex 2 - France)
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Conference papers
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http://hal.in2p3.fr/in2p3-00017913
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Friday, October 27, 2000 - 8:47:35 AM
Last modification on : Thursday, April 23, 2020 - 2:26:19 PM
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Friday, October 27, 2000 - 8:47:35 AM
Last modification on : Thursday, April 23, 2020 - 2:26:19 PM
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- HAL Id : in2p3-00017913, version 1
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CNRS | CGE | IN2P3 | SITE-ALSACE
Citation
J. Cailleret, C. Heitz, G. Lagarde, D. Tenorio, C. Scharager, et al.. Trace analysis in cadmium telluride by heavy ion induced X-ray emission and by SIMS. International Conference on Ion Beam Analysis 4, Jun 1979, Aarhus, Denmark. pp.367-371. ⟨in2p3-00017913⟩
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