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Trace analysis in cadmium telluride by heavy ion induced X-ray emission and by SIMS

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http://hal.in2p3.fr/in2p3-00017913
Contributor : Yvette Heyd <>
Submitted on : Friday, October 27, 2000 - 8:47:35 AM
Last modification on : Thursday, April 23, 2020 - 2:26:19 PM

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  • HAL Id : in2p3-00017913, version 1

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J. Cailleret, C. Heitz, G. Lagarde, D. Tenorio, C. Scharager, et al.. Trace analysis in cadmium telluride by heavy ion induced X-ray emission and by SIMS. International Conference on Ion Beam Analysis 4, Jun 1979, Aarhus, Denmark. pp.367-371. ⟨in2p3-00017913⟩

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