http://hal.in2p3.fr/in2p3-00017970 Contributor : Yvette HeydConnect in order to contact the contributor Submitted on : Friday, November 3, 2000 - 8:13:20 AM Last modification on : Wednesday, September 16, 2020 - 4:06:44 PM
M. Hage-Ali, P. Siffert. Compound semiconductors surface characterization by high resolution Rutherford backscattering. Nuclear Instruments and Methods, Elsevier, 1979, 166, pp.411-418. ⟨in2p3-00017970⟩