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Surface analysis by argon ion induced X-ray fluorescence

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http://hal.in2p3.fr/in2p3-00018018
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Tuesday, November 7, 2000 - 4:22:13 PM
Last modification on : Thursday, April 23, 2020 - 2:26:19 PM

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  • HAL Id : in2p3-00018018, version 1

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C. Heitz, M. Kwadow, D. Tenorio. Surface analysis by argon ion induced X-ray fluorescence. International Conference on Ion Beam Analysis 3, Jun 1977, Washington, United States. pp.483-488. ⟨in2p3-00018018⟩

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