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Conference papers

Interface studies of metal-semiconductor contacts by means of SIMs nuclear reaction and RBS

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Conference papers
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http://hal.in2p3.fr/in2p3-00018024
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Wednesday, November 8, 2000 - 8:47:11 AM
Last modification on : Thursday, April 23, 2020 - 2:26:19 PM

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  • HAL Id : in2p3-00018024, version 1

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J.P. Ponpon, J.J. Grob, A. Grob, R. Stuck, P. Siffert. Interface studies of metal-semiconductor contacts by means of SIMs nuclear reaction and RBS. International Conference on Ion Beam Analysis 3, Jun 1977, Washington, United States. pp.647-651. ⟨in2p3-00018024⟩

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