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in2p3-00018417, version 1
Evaluation of heavy ion energy losses in silicon due to a channelling phenomenon
J.J. Grob
1
A. Grob
1
P. Siffert
1
Details
1
IReS - Institut de Recherches Subatomiques
J.J. Grob
1
Author
A. Grob
1
Author
P. Siffert
1
Author
1
IReS - Institut de Recherches Subatomiques
(23 rue du Loess - BP 28 - 67037 Strasbourg Cedex 2 - France)
CNRS
: UMR7500
(France)
IN2P3
(France)
Cancéropôle du Grand Est
(France)
Université Louis Pasteur - Strasbourg I
(France)
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:
Journal articles
Le Vide
, 1974, 29, pp.374-379
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http://hal.in2p3.fr/in2p3-00018417
Contributor :
Yvette Heyd
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>
Submitted on : Wednesday, December 20, 2000 - 1:32:26 PM
Last modification on : Wednesday, December 20, 2000 - 1:32:26 PM
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in2p3-00018417, version 1
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Citation
J.J. Grob, A. Grob, P. Siffert. Evaluation of heavy ion energy losses in silicon due to a channelling phenomenon.
Le Vide
, 1974, 29, pp.374-379.
<in2p3-00018417>
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