http://hal.in2p3.fr/in2p3-00018417 Contributor : Yvette HeydConnect in order to contact the contributor Submitted on : Wednesday, December 20, 2000 - 1:32:26 PM Last modification on : Thursday, July 2, 2020 - 8:56:12 AM
J.J. Grob, A. Grob, P. Siffert. Evaluation of heavy ion energy losses in silicon due to a channelling phenomenon. Le Vide, Société française du vide, 1974, 29, pp.374-379. ⟨in2p3-00018417⟩