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Journal articles

Evaluation of heavy ion energy losses in silicon due to a channelling phenomenon

J.J. Grob 1 A. Grob 1 P. Siffert 1
1 IReS - Institut de Recherches Subatomiques
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http://hal.in2p3.fr/in2p3-00018417
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Wednesday, December 20, 2000 - 1:32:26 PM
Last modification on : Thursday, July 2, 2020 - 8:56:12 AM

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J.J. Grob, A. Grob, P. Siffert. Evaluation of heavy ion energy losses in silicon due to a channelling phenomenon. Le Vide, Société française du vide, 1974, 29, pp.374-379. ⟨in2p3-00018417⟩

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