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Journal articles

Studies of CdTe surfaces with secondary ion mass spectrometry, Rutherford backscattering and ellipsometry

M. Hage-Ali 1 R. Stuck 1 A.N. Saxena P. Siffert 1
1 IReS - Institut de Recherches Subatomiques
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http://hal.in2p3.fr/in2p3-00018429
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Wednesday, December 20, 2000 - 2:42:00 PM
Last modification on : Thursday, April 23, 2020 - 2:26:20 PM

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  • HAL Id : in2p3-00018429, version 1

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M. Hage-Ali, R. Stuck, A.N. Saxena, P. Siffert. Studies of CdTe surfaces with secondary ion mass spectrometry, Rutherford backscattering and ellipsometry. Applied Physics, Springer-Verlag, 1979, 19, pp.25-33. ⟨in2p3-00018429⟩

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