Skip to Main content Skip to Navigation
Journal articles

Thin dE/dx detector of uniform thickness made on epitaxial silicon

Complete list of metadata

http://hal.in2p3.fr/in2p3-00018474
Contributor : Yvette Heyd <>
Submitted on : Friday, December 22, 2000 - 8:02:32 AM
Last modification on : Tuesday, April 20, 2021 - 12:00:07 PM

Identifiers

  • HAL Id : in2p3-00018474, version 1

Citation

J.P. Ponpon, P. Siffert, F. Vazeille. Thin dE/dx detector of uniform thickness made on epitaxial silicon. Nuclear Instruments and Methods, Elsevier, 1973, 112, pp.465-467. ⟨in2p3-00018474⟩

Share

Metrics

Record views

122