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Journal articles

Thin dE/dx detector of uniform thickness made on epitaxial silicon

J.P. Ponpon 1 P. Siffert 1 F. Vazeille 2
1 IReS - Institut de Recherches Subatomiques
2 LPC - Laboratoire de Physique Corpusculaire - Clermont-Ferrand
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Journal articles
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http://hal.in2p3.fr/in2p3-00018474
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Friday, December 22, 2000 - 8:02:32 AM
Last modification on : Thursday, December 16, 2021 - 2:10:22 PM

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  • HAL Id : in2p3-00018474, version 1

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LPC-CLERMONT | CNRS | CGE | IN2P3 | PRES_CLERMONT | SITE-ALSACE

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J.P. Ponpon, P. Siffert, F. Vazeille. Thin dE/dx detector of uniform thickness made on epitaxial silicon. Nuclear Instruments and Methods, Elsevier, 1973, 112, pp.465-467. ⟨in2p3-00018474⟩

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