Trapping effects in Ge(Li) detectors and search for correlation with characteristics measured on the p-type crystals

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Journal articles
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers (IEEE), 1970, 17, pp.149-159


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Submitted on : Friday, December 22, 2000 - 10:00:03 AM
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  • HAL Id : in2p3-00018483, version 1

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R. Henck, D. Gutknecht, P. Siffert, L.De Laet, W. Schoenmaekers. Trapping effects in Ge(Li) detectors and search for correlation with characteristics measured on the p-type crystals. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers (IEEE), 1970, 17, pp.149-159. <in2p3-00018483>

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