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Trapping effects in Ge(Li) detectors and search for correlation with characteristics measured on the p-type crystals

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http://hal.in2p3.fr/in2p3-00018483
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Friday, December 22, 2000 - 10:03:22 AM
Last modification on : Thursday, April 23, 2020 - 2:26:20 PM

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  • HAL Id : in2p3-00018483, version 1

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R. Henck, D. Gutknecht, P. Siffert, L.De Laet, W. Schoenmaekers. Trapping effects in Ge(Li) detectors and search for correlation with characteristics measured on the p-type crystals. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 1970, 17, pp.149-159. ⟨in2p3-00018483⟩

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