http://hal.in2p3.fr/in2p3-00019453 Contributor : Yvette HeydConnect in order to contact the contributor Submitted on : Wednesday, May 30, 2001 - 1:47:32 PM Last modification on : Thursday, April 23, 2020 - 2:26:20 PM
B. Hartiti, A. Slaoui, J.C. Muller, P. Siffert. Thermal annealing of excimer-laser-induced defects in virgin silicon. Materials Science and Engineering, Elsevier, 1989, B4, pp.257-260. ⟨in2p3-00019453⟩