Skip to Main content Skip to Navigation
Journal articles

Direct measurement of the maximum depth phase change of crystal silicon under pulsed laser irradiation

Complete list of metadata

http://hal.in2p3.fr/in2p3-00019467
Contributor : Yvette Heyd <>
Submitted on : Thursday, May 31, 2001 - 8:44:33 AM
Last modification on : Wednesday, February 17, 2021 - 11:50:24 AM

Identifiers

  • HAL Id : in2p3-00019467, version 1

Citation

M. Toulemonde, R. Heddache, F. Nielsen, P. Siffert. Direct measurement of the maximum depth phase change of crystal silicon under pulsed laser irradiation. Journal of Applied Physics, American Institute of Physics, 1984, 56, pp.1878-1880. ⟨in2p3-00019467⟩

Share

Metrics

Record views

210