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Secondary ion mass spectrometry (SIMS)

R. Stuck 1 P. Siffert 1
1 IReS - Institut de Recherches Subatomiques
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http://hal.in2p3.fr/in2p3-00019470
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Thursday, May 31, 2001 - 9:06:02 AM
Last modification on : Thursday, April 23, 2020 - 2:26:20 PM

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  • HAL Id : in2p3-00019470, version 1

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R. Stuck, P. Siffert. Secondary ion mass spectrometry (SIMS). Progress in Crystal Growth and Characterization of Materials, Elsevier, 1984, 8, pp.11-57. ⟨in2p3-00019470⟩

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