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Submitted on : Thursday, May 31, 2001 - 9:06:02 AM Last modification on : Thursday, April 23, 2020 - 2:26:20 PM
R. Stuck, P. Siffert. Secondary ion mass spectrometry (SIMS). Progress in Crystal Growth and Characterization of Materials, Elsevier, 1984, 8, pp.11-57. ⟨in2p3-00019470⟩