HAL will be down for maintenance from Friday, June 10 at 4pm through Monday, June 13 at 9am. More information
Skip to Main content Skip to Navigation
Journal articles

Characterization of EFG silicon ribbons by ion beam techniques

M. Hage-Ali 1 R. Stuck 1 M. Toulemonde 1 P. Siffert 1
1 IReS - Institut de Recherches Subatomiques
Document type :
Journal articles
Complete list of metadata
http://hal.in2p3.fr/in2p3-00019487
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Thursday, May 31, 2001 - 1:21:34 PM
Last modification on : Wednesday, February 17, 2021 - 11:50:42 AM

Identifiers

  • HAL Id : in2p3-00019487, version 1

Collections

CNRS | CGE | IN2P3 | SITE-ALSACE | MADIR-CIMAP | CIMAP | COMUE-NORMANDIE | ENSICAEN | UNICAEN

Citation

M. Hage-Ali, R. Stuck, M. Toulemonde, P. Siffert. Characterization of EFG silicon ribbons by ion beam techniques. Solar Cells, Elsevier, 1980, 1, pp.153-157. ⟨in2p3-00019487⟩

Export

BibTeX TEI DC DCterms EndNote Datacite

Share

Metrics

Record views

5