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Characterization of EFG silicon ribbons by ion beam techniques

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http://hal.in2p3.fr/in2p3-00019487
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Thursday, May 31, 2001 - 1:21:34 PM
Last modification on : Wednesday, February 17, 2021 - 11:50:42 AM

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  • HAL Id : in2p3-00019487, version 1

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M. Hage-Ali, R. Stuck, M. Toulemonde, P. Siffert. Characterization of EFG silicon ribbons by ion beam techniques. Solar Cells, Elsevier, 1980, 1, pp.153-157. ⟨in2p3-00019487⟩

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