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Defects introduced in silicon by irradiation with muons of gev energy

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http://hal.in2p3.fr/in2p3-00019491
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Thursday, May 31, 2001 - 2:37:16 PM
Last modification on : Thursday, April 23, 2020 - 2:26:20 PM

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  • HAL Id : in2p3-00019491, version 1

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J.C. Muller, P. Siffert, H.M. Heijne. Defects introduced in silicon by irradiation with muons of gev energy. International Conference On Radiation Effects In Semiconductors, Sep 1976, Dubrovnik, pp.505-506. ⟨in2p3-00019491⟩

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