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STIM tomography : a potential tool for the non-destructive characterisation of SiC microcomposite materials

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http://hal.in2p3.fr/in2p3-00019680
Contributor : Pascale Chambon <>
Submitted on : Tuesday, September 25, 2001 - 7:00:06 PM
Last modification on : Thursday, February 18, 2021 - 2:10:05 PM

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  • HAL Id : in2p3-00019680, version 1

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P. Moretto, C. Michelet, S. Le Gallet, F. Rebillat, A. Guette, et al.. STIM tomography : a potential tool for the non-destructive characterisation of SiC microcomposite materials. International Conference on Nuclear Microprobe Technology and Applications 7, Sep 2000, Bordeaux, France. pp.238-243. ⟨in2p3-00019680⟩

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