Half-life measurements for $^{61}$Ga, $^{63}$Ge, and $^{65}$As and their importance in the rp process

J.A. Winger; D.P. Bazin; W. Benenson; G.M. Crawley; D.J. Morrissey; N.A. Orr; R. Pfaff; B.M. Sherrill; M. Thoennessen; S.J. Yennello; B.M. Young

Half-life measurements for $^{61}$Ga, $^{63}$Ge, and $^{65}$As and their importance in the rp process

J.A. Winger D.P. Bazin W. Benenson G.M. Crawley D.J. Morrissey N.A. Orr ¹ R. Pfaff B.M. Sherrill M. Thoennessen S.J. Yennello B.M. Young

1 LPCC - Laboratoire de Physique Corpusculaire de Caen

Document type :

Journal articles

Physical Review C, American Physical Society, 1993, 48, pp.3097-3105

Domain :

Physics [physics] / Nuclear Experiment [nucl-ex]

http://hal.in2p3.fr/in2p3-00019777
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Submitted on : Friday, February 8, 2002 - 3:09:06 PM
Last modification on : Friday, July 3, 2015 - 10:18:03 AM

Half-life measurements for $^{61}$Ga, $^{63}$Ge, and $^{65}$As and their importance in the rp process

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