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Test beam analysis of the effect of highly ionising particles on the silicon strip tracker

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http://hal.in2p3.fr/in2p3-00020330
Contributor : Sylvie Flores <>
Submitted on : Monday, January 26, 2004 - 2:42:26 PM
Last modification on : Thursday, December 10, 2020 - 6:36:03 PM

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  • HAL Id : in2p3-00020330, version 1

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W. Adam, W. Beaumont, V. Zhukov, D. Contardo, N. Lumb, et al.. Test beam analysis of the effect of highly ionising particles on the silicon strip tracker. 2003, pp.41. ⟨in2p3-00020330⟩

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