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Journal articles
Evidence for the ion-induced electronic spike on $fs$ and $nm$ scales from transient field measurements
K.-H. Speidel
S. Schielke
O. Kenn
J. Leske
D. Hohn
G. Müller
R. Ernst
N. Gemein
M. Offer
J. Gerber
1
P. Maier-Komor
M. Toulemonde
M. Offer
Author
J. Gerber 1
Author
P. Maier-Komor
Author
M. Toulemonde
Author IdHAL : marcel-toulemonde
1
IReS - Institut de Recherches Subatomiques (23 rue du Loess - BP 28 - 67037 Strasbourg Cedex 2 - France)
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Journal articles
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http://hal.in2p3.fr/in2p3-00023252
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Wednesday, November 3, 2004 - 10:45:50 AM
Last modification on : Wednesday, February 17, 2021 - 11:50:40 AM
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Wednesday, November 3, 2004 - 10:45:50 AM
Last modification on : Wednesday, February 17, 2021 - 11:50:40 AM
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- HAL Id : in2p3-00023252, version 1
- DOI : 10.1016/j.nimb.2004.05.030
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CNRS | CGE | IN2P3 | SITE-ALSACE | MADIR-CIMAP | CIMAP | COMUE-NORMANDIE | ENSICAEN | UNICAEN
Citation
K.-H. Speidel, S. Schielke, O. Kenn, J. Leske, D. Hohn, et al.. Evidence for the ion-induced electronic spike on $fs$ and $nm$ scales from transient field measurements. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2004, 225, pp.604-616. ⟨10.1016/j.nimb.2004.05.030⟩. ⟨in2p3-00023252⟩
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