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Evidence for the ion-induced electronic spike on $fs$ and $nm$ scales from transient field measurements

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http://hal.in2p3.fr/in2p3-00023252
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Wednesday, November 3, 2004 - 10:45:50 AM
Last modification on : Wednesday, February 17, 2021 - 11:50:40 AM

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K.-H. Speidel, S. Schielke, O. Kenn, J. Leske, D. Hohn, et al.. Evidence for the ion-induced electronic spike on $fs$ and $nm$ scales from transient field measurements. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2004, 225, pp.604-616. ⟨10.1016/j.nimb.2004.05.030⟩. ⟨in2p3-00023252⟩

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