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Quantitative analysis of radiation-induced disorder in spinel crystals

Abstract : Structural defects in the surface region of magnesium aluminate spinel ($MgAl_2O_4$) crystals irradiated with 450 MeV Xe ions were analyzed by using $^4He$ backscattering in channeling geometry (RBS/C). Monte-Carlo simulations applied for the interpretation of channeling spectra permitted to determine the concentration of radiation-induced defects. They showed that the defect distributions are depth dependent, likely due to annihilation of defects at the surface of the crystals. The cross-section for the formation of defects by swift Xe ions, and consequently the diameter of an ion track, were estimated using single-impact-model calculations.
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Contributor : Dominique Girod <>
Submitted on : Tuesday, December 13, 2005 - 10:31:56 AM
Last modification on : Wednesday, September 16, 2020 - 4:17:34 PM

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L. Thomé, J. Jagielski, A. Gentils, L. Nowicki, F. Garrido. Quantitative analysis of radiation-induced disorder in spinel crystals. 14th International Conference on Ion Beam Modification of Materials, Sep 2004, Pacific Grove, United States. pp.643-645, ⟨10.1016/j.nimb.2005.08.086⟩. ⟨in2p3-00025217⟩

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