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Tests of monolithic active pixel sensors at national synchrotron light source

Abstract : The paper discusses basic characterization of Monolithic Active Pixel Sensors (MAPS) carried out at the X12A beam-line at National Synchrotron Light Source (NSLS), Upton, NY, USA. The tested device was a MIMOSA V (MV) chip, back-thinned down to the epitaxial layer. This 1M pixels device features a pixel size of 17X17µm^2 and was designed in a 0,6µm CMOS process. The X-ray beam energies used range from 5 to 12 keV. Examples of direct X-ray imaging capabilities are presented.
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http://hal.in2p3.fr/in2p3-00133539
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Submitted on : Wednesday, March 7, 2007 - 11:37:38 AM
Last modification on : Tuesday, July 21, 2020 - 10:02:03 AM
Long-term archiving on: : Saturday, May 14, 2011 - 2:34:33 AM

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G. Deptuch, A. Besson, G.A. Carini, D.P. Siddons, M. Szeleniak, et al.. Tests of monolithic active pixel sensors at national synchrotron light source. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Elsevier, 2007, 570, pp.165-170. ⟨10.1016/j.nima.2006.09.092⟩. ⟨in2p3-00133539⟩

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