Skip to Main content Skip to Navigation
Conference papers

Scanning force microscopy of surface damage created by fast $C_60$ cluster ions in $CaF_2$ and $LaF_3$ single crystals

Abstract : Single crystals of CaF2 and LaF3 were exposed to 30-MeV C60 clusters from the tandem accelerator in Orsay, extending earlier irradiation experiments with monoatomic swift heavy ions to larger energy loss values. The irradiated crystal surfaces were investigated by scanning force microscopy (SFM) in contact mode. Topographic images reveal nanometric hillock-like structures protruding from the surface at each cluster impact site. The hillock diameter and height are analyzed and compared to monoatomic projectiles.
Document type :
Conference papers
Complete list of metadatas

http://hal.in2p3.fr/in2p3-00151802
Contributor : Suzanne Robert <>
Submitted on : Tuesday, June 5, 2007 - 12:18:00 PM
Last modification on : Wednesday, September 16, 2020 - 4:08:14 PM

Identifiers

Citation

A.S. El-Said, F. Aumayr, S. Della-Negra, R. Neumann, K. Schwartz, et al.. Scanning force microscopy of surface damage created by fast $C_60$ cluster ions in $CaF_2$ and $LaF_3$ single crystals. 22nd International Conference on Atomic Collisions in Solids, Jul 2006, Berlin, Germany. pp.313-318, ⟨10.1016/j.nimb.2006.12.025⟩. ⟨in2p3-00151802⟩

Share

Metrics

Record views

184